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Deep Learning with Reflection High-Energy Electron Diffraction Images to Predict Cation Ratio in Sr2xTi2(1-x)O3 Thin Films.

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Title: Deep Learning with Reflection High-Energy Electron Diffraction Images to Predict Cation Ratio in Sr2xTi2(1-x)O3 Thin Films.
Authors: Harris SB; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States., Gemperline PT; Department of Physics, Auburn University, 315 Roosevelt Concourse, Auburn, Alabama 36849, United States., Rouleau CM; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States., Vasudevan RK; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States., Comes RB; Department of Physics, Auburn University, 315 Roosevelt Concourse, Auburn, Alabama 36849, United States.; Department of Materials Science and Engineering, University of Delaware, 201 DuPont Hall, Newark, Delaware 19716, United States.
Source: Nano letters [Nano Lett] 2025 Apr 09; Vol. 25 (14), pp. 5867-5874. Date of Electronic Publication: 2025 Mar 31.
Publication Type: Journal Article
Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101088070 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1530-6992 (Electronic) Linking ISSN: 15306984 NLM ISO Abbreviation: Nano Lett Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: Deep Learning with Reflection High-Energy Electron Diffraction Images to Predict Cation Ratio in Sr<subscript>2x</subscript>Ti<subscript>2(1-x)</subscript>O<subscript>3</subscript> Thin Films.
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  Data: <searchLink fieldCode="AU" term="%22Harris+SB%22">Harris SB</searchLink>; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.<br /><searchLink fieldCode="AU" term="%22Gemperline+PT%22">Gemperline PT</searchLink>; Department of Physics, Auburn University, 315 Roosevelt Concourse, Auburn, Alabama 36849, United States.<br /><searchLink fieldCode="AU" term="%22Rouleau+CM%22">Rouleau CM</searchLink>; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.<br /><searchLink fieldCode="AU" term="%22Vasudevan+RK%22">Vasudevan RK</searchLink>; Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.<br /><searchLink fieldCode="AU" term="%22Comes+RB%22">Comes RB</searchLink>; Department of Physics, Auburn University, 315 Roosevelt Concourse, Auburn, Alabama 36849, United States.; Department of Materials Science and Engineering, University of Delaware, 201 DuPont Hall, Newark, Delaware 19716, United States.
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  Data: <searchLink fieldCode="JN" term="%22101088070%22">Nano letters</searchLink> [Nano Lett] 2025 Apr 09; Vol. 25 (14), pp. 5867-5874. <i>Date of Electronic Publication: </i>2025 Mar 31.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22American+Chemical+Society%22">American Chemical Society </searchLink><i>Country of Publication: </i>United States <i>NLM ID: </i>101088070 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1530-6992 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2215306984%22">15306984 </searchLink><i>NLM ISO Abbreviation: </i>Nano Lett <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
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        Value: 10.1021/acs.nanolett.5c00787
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      – Code: eng
        Text: English
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      – TitleFull: Deep Learning with Reflection High-Energy Electron Diffraction Images to Predict Cation Ratio in Sr2xTi2(1-x)O3 Thin Films.
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              Text: 2025 Apr 09
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