A 2.5-20 kSps in-pixel direct digitization ECoG front-end with sub-millisecond stimulation artifact recovery.

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Bibliographic Details
Title: A 2.5-20 kSps in-pixel direct digitization ECoG front-end with sub-millisecond stimulation artifact recovery.
Authors: Jain A; Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, CA 92093 USA., Fogleman E; Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, CA 92093 USA., Botros P; Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, CA 92093 USA., Vatsyayan R; Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, CA 92093 USA., Koruprolu A; Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, CA 92093 USA., Pochet C; Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, CA 92093 USA., Bourhis A; Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, CA 92093 USA., Liu Z; Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, CA 92093 USA., Chethan S; Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, CA 92093 USA., Le HP; Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, CA 92093 USA., Galton I; Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, CA 92093 USA., Dayeh SA; Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, CA 92093 USA., Hall DA; Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, CA 92093 USA.
Source: IEEE journal of solid-state circuits [IEEE J Solid-State Circuits] 2025 Mar; Vol. 60 (3), pp. 894-907. Date of Electronic Publication: 2024 Dec 18.
Publication Type: Journal Article
Journal Info: Publisher: Institute of Electrical and Electronics Engineers Country of Publication: United States NLM ID: 101212687 Publication Model: Print-Electronic Cited Medium: Print ISSN: 0018-9200 (Print) Linking ISSN: 00189200 NLM ISO Abbreviation: IEEE J Solid-State Circuits Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:0018-9200
DOI:10.1109/jssc.2024.3508544