Low frequency band pass Fourier filtering for irradiation damage analysis in the transmission electron microscope.
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| Title: | Low frequency band pass Fourier filtering for irradiation damage analysis in the transmission electron microscope. |
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| Authors: | Foley DL; Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, MD 21218, United States., Mang EH; Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, MD 21218, United States., Wang Y; Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545, United States; Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545, United States., Spearot DE; University of Florida, Department of Mechanical & Aerospace Engineering, Gainesville, FL 32611, United States., Taheri ML; Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, MD 21218, United States. Electronic address: mtaheri4@jhu.edu. |
| Source: | Micron (Oxford, England : 1993) [Micron] 2025 Sep; Vol. 196-197, pp. 103864. Date of Electronic Publication: 2025 Jun 07. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Pergamon Press Country of Publication: England NLM ID: 9312850 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1878-4291 (Electronic) Linking ISSN: 09684328 NLM ISO Abbreviation: Micron Subsets: MEDLINE; PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
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