| Authors: |
Ahn KJ; Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, 16419, Republic of Korea., Yun DK; Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, 16419, Republic of Korea., Park MH; Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, 16419, Republic of Korea., Yun HW; Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, 16419, Republic of Korea., Nguyen MC; Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, 16419, Republic of Korea., Vu VT; Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, 16419, Republic of Korea., Li H; Department of Electrical Engineering, University at Buffalo, The State University of New York, Buffalo, NY, 14260, USA., Aggarwal P; Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, 16419, Republic of Korea., Yu WJ; Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, 16419, Republic of Korea. |