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Electrical Performance and Deep-Level Trap Characterization of p-CuGaO2/β-Ga2O3 Heterojunctions for Power Electronics.

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Title: Electrical Performance and Deep-Level Trap Characterization of p-CuGaO2/β-Ga2O3 Heterojunctions for Power Electronics.
Authors: Venkata Prasad C; Department of Semiconductor Systems Engineering and Convergence Engineering for Intelligent Drone, Sejong University, Seoul 05006, Republic of Korea.; Department of Semiconductor Systems Engineering, Sejong University, Seoul 05006, Republic of Korea., Lee GH; Department of Electronic Materials Engineering, Kwangwoon University, Seoul 01897, South Korea., Park JH; Department of Semiconductor Systems Engineering and Convergence Engineering for Intelligent Drone, Sejong University, Seoul 05006, Republic of Korea.; Department of Semiconductor Systems Engineering, Sejong University, Seoul 05006, Republic of Korea., Shaikshavali D; Electronics and Communication Engineering, QIS College of Engineering and Technology, Vegamukkapalem, Ongole, Andhra Pradesh 523272, India., Kim KJ; Department of Semiconductor Systems Engineering and Convergence Engineering for Intelligent Drone, Sejong University, Seoul 05006, Republic of Korea.; Department of Semiconductor Systems Engineering, Sejong University, Seoul 05006, Republic of Korea., Jeon HJ; Department of Semiconductor Systems Engineering and Convergence Engineering for Intelligent Drone, Sejong University, Seoul 05006, Republic of Korea.; Department of Semiconductor Systems Engineering, Sejong University, Seoul 05006, Republic of Korea., Jaiswal NK; Centre for Industrial Electronics, Institute of Mechanical and Electrical Engineering, University of Southern Denmark, Alison 2, Sønderborg 6400, Denmark., Yu MG; Department of Semiconductor Systems Engineering and Convergence Engineering for Intelligent Drone, Sejong University, Seoul 05006, Republic of Korea.; Department of Semiconductor Systems Engineering, Sejong University, Seoul 05006, Republic of Korea., Labed M; Department of Semiconductor Systems Engineering and Convergence Engineering for Intelligent Drone, Sejong University, Seoul 05006, Republic of Korea.; Department of Semiconductor Systems Engineering, Sejong University, Seoul 05006, Republic of Korea., Koo SM; Department of Electronic Materials Engineering, Kwangwoon University, Seoul 01897, South Korea., Rim YS; Department of Semiconductor Systems Engineering and Convergence Engineering for Intelligent Drone, Sejong University, Seoul 05006, Republic of Korea.; Department of Semiconductor Systems Engineering, Sejong University, Seoul 05006, Republic of Korea.
Source: ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2025 Jul 23; Vol. 17 (29), pp. 42066-42081. Date of Electronic Publication: 2025 Jul 08.
Publication Type: Journal Article
Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101504991 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1944-8252 (Electronic) Linking ISSN: 19448244 NLM ISO Abbreviation: ACS Appl Mater Interfaces Subsets: MEDLINE; PubMed not MEDLINE
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  Data: Electrical Performance and Deep-Level Trap Characterization of p-CuGaO<subscript>2</subscript>/β-Ga<subscript>2</subscript>O<subscript>3</subscript> Heterojunctions for Power Electronics.
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  Data: <searchLink fieldCode="AU" term="%22Venkata+Prasad+C%22">Venkata Prasad C</searchLink>; Department of Semiconductor Systems Engineering and Convergence Engineering for Intelligent Drone, Sejong University, Seoul 05006, Republic of Korea.; Department of Semiconductor Systems Engineering, Sejong University, Seoul 05006, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Lee+GH%22">Lee GH</searchLink>; Department of Electronic Materials Engineering, Kwangwoon University, Seoul 01897, South Korea.<br /><searchLink fieldCode="AU" term="%22Park+JH%22">Park JH</searchLink>; Department of Semiconductor Systems Engineering and Convergence Engineering for Intelligent Drone, Sejong University, Seoul 05006, Republic of Korea.; Department of Semiconductor Systems Engineering, Sejong University, Seoul 05006, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Shaikshavali+D%22">Shaikshavali D</searchLink>; Electronics and Communication Engineering, QIS College of Engineering and Technology, Vegamukkapalem, Ongole, Andhra Pradesh 523272, India.<br /><searchLink fieldCode="AU" term="%22Kim+KJ%22">Kim KJ</searchLink>; Department of Semiconductor Systems Engineering and Convergence Engineering for Intelligent Drone, Sejong University, Seoul 05006, Republic of Korea.; Department of Semiconductor Systems Engineering, Sejong University, Seoul 05006, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Jeon+HJ%22">Jeon HJ</searchLink>; Department of Semiconductor Systems Engineering and Convergence Engineering for Intelligent Drone, Sejong University, Seoul 05006, Republic of Korea.; Department of Semiconductor Systems Engineering, Sejong University, Seoul 05006, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Jaiswal+NK%22">Jaiswal NK</searchLink>; Centre for Industrial Electronics, Institute of Mechanical and Electrical Engineering, University of Southern Denmark, Alison 2, Sønderborg 6400, Denmark.<br /><searchLink fieldCode="AU" term="%22Yu+MG%22">Yu MG</searchLink>; Department of Semiconductor Systems Engineering and Convergence Engineering for Intelligent Drone, Sejong University, Seoul 05006, Republic of Korea.; Department of Semiconductor Systems Engineering, Sejong University, Seoul 05006, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Labed+M%22">Labed M</searchLink>; Department of Semiconductor Systems Engineering and Convergence Engineering for Intelligent Drone, Sejong University, Seoul 05006, Republic of Korea.; Department of Semiconductor Systems Engineering, Sejong University, Seoul 05006, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Koo+SM%22">Koo SM</searchLink>; Department of Electronic Materials Engineering, Kwangwoon University, Seoul 01897, South Korea.<br /><searchLink fieldCode="AU" term="%22Rim+YS%22">Rim YS</searchLink>; Department of Semiconductor Systems Engineering and Convergence Engineering for Intelligent Drone, Sejong University, Seoul 05006, Republic of Korea.; Department of Semiconductor Systems Engineering, Sejong University, Seoul 05006, Republic of Korea.
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  Data: <searchLink fieldCode="JN" term="%22101504991%22">ACS applied materials & interfaces</searchLink> [ACS Appl Mater Interfaces] 2025 Jul 23; Vol. 17 (29), pp. 42066-42081. <i>Date of Electronic Publication: </i>2025 Jul 08.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22American+Chemical+Society%22">American Chemical Society </searchLink><i>Country of Publication: </i>United States <i>NLM ID: </i>101504991 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1944-8252 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2219448244%22">19448244 </searchLink><i>NLM ISO Abbreviation: </i>ACS Appl Mater Interfaces <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
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              Text: 2025 Jul 23
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