Advanced stability and energy storage capacity in hierarchically engineered Bi0.5Na0.5TiO3-based multilayer capacitors.
Saved in:
| Title: | Advanced stability and energy storage capacity in hierarchically engineered Bi |
|---|---|
| Authors: | Zhao W; Electronic Materials Research Laboratory & Multifunctional Materials and Structures, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, China., Liu Z; School of Materials Science and Engineering & Advanced Research Institute of Multidisciplinary Science, Beijing Institute of Technology, Beijing, China., Xu D; Electronic Materials Research Laboratory & Multifunctional Materials and Structures, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, China. diming.xu@xjtu.edu.cn., Wang G; Department of Materials, University of Manchester, Manchester, UK., Li D; Electronic Materials Research Laboratory & Multifunctional Materials and Structures, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, China., Liu J; Electronic Materials Research Laboratory & Multifunctional Materials and Structures, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, China., Wang Z; Electronic Materials Research Laboratory & Multifunctional Materials and Structures, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, China., Guo Y; Electronic Materials Research Laboratory & Multifunctional Materials and Structures, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, China., Ren J; Electronic Materials Research Laboratory & Multifunctional Materials and Structures, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, China., Zhou T; School of Electronic and Information Engineering, Hangzhou Dianzi University, Hangzhou, Zhejiang, China. zhou.tao@hdu.edu.cn., Pang L; Micro-optoelectronic Systems Laboratories Xi'an Technological University, Xi'an, Shaanxi, China., Yang H; National Engineering Research Center of UHV Technology and New Electrical Equipment, China Southern Power Grid Research Institute Co., Ltd, Guangzhou, Guangdong, China., Liu W; State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an, Shaanxi, China. liuwenfeng@mail.xjtu.edu.cn., Huang H; School of Materials Science and Engineering & Advanced Research Institute of Multidisciplinary Science, Beijing Institute of Technology, Beijing, China. hbhuang@bit.edu.cn., Zhou D; Electronic Materials Research Laboratory & Multifunctional Materials and Structures, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, China. zhoudi1220@gmail.com. |
| Source: | Nature communications [Nat Commun] 2025 Jul 16; Vol. 16 (1), pp. 6549. Date of Electronic Publication: 2025 Jul 16. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: MEDLINE; PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
|
Full text is not displayed to guests.
Login for full access.
|
|
| ISSN: | 2041-1723 |
|---|---|
| DOI: | 10.1038/s41467-025-61936-2 |
