Depth of field of multi-slice electron ptychography: Investigating energy and convergence angle.

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Bibliographic Details
Title: Depth of field of multi-slice electron ptychography: Investigating energy and convergence angle.
Authors: Allars F; Electron Physical Science Imaging Centre, Diamond Light Source, Harwell Science and Innovation Campus, Fermi Avenue, Didcot, UK.; Diamond Light Source, Harwell Science and Innovation Campus, Fermi Avenue, Didcot, UK., Maiden A; Diamond Light Source, Harwell Science and Innovation Campus, Fermi Avenue, Didcot, UK.; School of Electrical and Electronic Engineering, University of Sheffield, Sheffield, UK., Batey DJ; Diamond Light Source, Harwell Science and Innovation Campus, Fermi Avenue, Didcot, UK., Allen CS; Electron Physical Science Imaging Centre, Diamond Light Source, Harwell Science and Innovation Campus, Fermi Avenue, Didcot, UK.; Department of Materials, University of Oxford, Oxford, UK.
Source: Journal of microscopy [J Microsc] 2025 Nov; Vol. 300 (2), pp. 191-200. Date of Electronic Publication: 2025 Oct 06.
Publication Type: Journal Article
Journal Info: Publisher: Published for the Royal Microscopical Society by Blackwell Scientific Publications Country of Publication: England NLM ID: 0204522 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1365-2818 (Electronic) Linking ISSN: 00222720 NLM ISO Abbreviation: J Microsc Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:1365-2818
DOI:10.1111/jmi.70039