Shift in sex and age of individuals at a clinical high risk (CHR) for psychosis: relation to differences in recruitment methods and effect on sample characteristics.

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Title: Shift in sex and age of individuals at a clinical high risk (CHR) for psychosis: relation to differences in recruitment methods and effect on sample characteristics.
Authors: Farina EA; Yale University School of Medicine and the Connecticut Mental Health Center, New Haven, CT, USA. Emily.Farina@yale.edu., Mourgues-Codern C; Yale University School of Medicine and the Connecticut Mental Health Center, New Haven, CT, USA., Stimler K; Yale University School of Medicine and the Connecticut Mental Health Center, New Haven, CT, USA., Kenney J; Yale University School of Medicine and the Connecticut Mental Health Center, New Haven, CT, USA., Saxena A; Yale University School of Medicine and the Connecticut Mental Health Center, New Haven, CT, USA., Mukhtar H; Yale University School of Medicine and the Connecticut Mental Health Center, New Haven, CT, USA., Addington J; Department of Psychiatry, Hotchkiss Brain Institute, University of Calgary, Calgary, Alberta, Canada., Bearden CE; Department of Psychiatry and Biobehavioral Sciences and Psychology, Semel Institute for Neuroscience and Human Behavior, University of California Los Angeles, Los Angeles, CA, USA., Cadenhead KS; Department of Psychiatry, University of California San Diego, La Jolla, CA, USA., Cannon TD; Yale University School of Medicine and the Connecticut Mental Health Center, New Haven, CT, USA.; Department of Psychology, Yale University, New Haven, CT, USA., Cornblatt B; Department of Psychiatry, Zucker Hillside Hospital, Long Island, NY, USA., Ellman L; Department of Psychology, Temple University, Philadelphia, PA, USA., Gold J; Maryland Psychiatric Research Center, University of Maryland School of Medicine, Catonsville, MD, USA., Keshavan M; Department of Psychiatry, Harvard Medical School at Beth Israel Deaconess Medical Center and Massachusetts General Hospital, Boston, MA, USA., Mathalon DH; Department of Psychiatry, UCSF, and SF VA Medical Center, San Francisco, CA, USA., Mittal VA; Institutes for Policy Research (IPR) and Innovations in Developmental Sciences (DevSci), Departments of Psychology, Psychiatry, Medical Social Sciences, Northwestern University, Evanston, IL, 60208, USA., Perkins DO; Department of Psychiatry, University of North Carolina, Chapel Hill, NC, USA., Schiffman J; Department of Psychological Science, University of California Irvine, Irvine, CA, USA., Silverstein SM; Center for Visual Science, Departments of Psychiatry, Neuroscience and Ophthalmology, University of Rochester Medical Center, Rochester, NY, USA., Strauss GP; Departments of Psychology and Neuroscience, University of Georgia, Athens, GA, USA., Stone WS; Department of Psychiatry, Harvard Medical School at Beth Israel Deaconess Medical Center and Massachusetts General Hospital, Boston, MA, USA., Walker EF; Departments of Psychology and Psychiatry, Emory University, Atlanta, GA, USA., Waltz J; Maryland Psychiatric Research Center, Department of Psychiatry, University of Maryland School of Medicine, Baltimore, MD, USA., Corlett P; Yale University School of Medicine and the Connecticut Mental Health Center, New Haven, CT, USA., Powers AR; Yale University School of Medicine and the Connecticut Mental Health Center, New Haven, CT, USA.; Department of Psychology, Yale University, New Haven, CT, USA., Woods SW; Yale University School of Medicine and the Connecticut Mental Health Center, New Haven, CT, USA.
Source: Schizophrenia (Heidelberg, Germany) [Schizophrenia (Heidelb)] 2025 Oct 06; Vol. 11 (1), pp. 123. Date of Electronic Publication: 2025 Oct 06.
Publication Type: Journal Article
Journal Info: Publisher: Springer Nature Limited Country of Publication: Germany NLM ID: 9918367987006676 Publication Model: Electronic Cited Medium: Internet ISSN: 2754-6993 (Electronic) Linking ISSN: 27546993 NLM ISO Abbreviation: Schizophrenia (Heidelb) Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
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ISSN:2754-6993
DOI:10.1038/s41537-025-00663-5