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Tailoring resistive switching in ultra-thin tellurium films by interface engineering.

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Title: Tailoring resistive switching in ultra-thin tellurium films by interface engineering.
Authors: Ghomi S; CNR IMM, Unit of Agrate Brianza, via C. Olivetti 2, Agrate Brianza 20864, Italy. christian.martella@cnr.it., Grazianetti C; CNR IMM, Unit of Agrate Brianza, via C. Olivetti 2, Agrate Brianza 20864, Italy. christian.martella@cnr.it., Serafini A; STMicroelectronics, via C. Olivetti 2, Agrate Brianza 20864, Italy., Targa P; STMicroelectronics, via C. Olivetti 2, Agrate Brianza 20864, Italy., Codegoni D; STMicroelectronics, via C. Olivetti 2, Agrate Brianza 20864, Italy., Lamperti A; CNR IMM, Unit of Agrate Brianza, via C. Olivetti 2, Agrate Brianza 20864, Italy. christian.martella@cnr.it., Martella C; CNR IMM, Unit of Agrate Brianza, via C. Olivetti 2, Agrate Brianza 20864, Italy. christian.martella@cnr.it., Molle A; CNR IMM, Unit of Agrate Brianza, via C. Olivetti 2, Agrate Brianza 20864, Italy. christian.martella@cnr.it.
Source: Nanoscale horizons [Nanoscale Horiz] 2025 Nov 17; Vol. 10 (12), pp. 3478-3485. Date of Electronic Publication: 2025 Nov 17.
Publication Type: Journal Article
Journal Info: Publisher: Royal Society of Chemistry Country of Publication: England NLM ID: 101712576 Publication Model: Electronic Cited Medium: Internet ISSN: 2055-6764 (Electronic) Linking ISSN: 20556756 NLM ISO Abbreviation: Nanoscale Horiz Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:2055-6764
DOI:10.1039/d5nh00427f