Enhanced valley polarization in MoS2via substrate-induced strain and transition dipole moment modulation.

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Title: Enhanced valley polarization in MoS2via substrate-induced strain and transition dipole moment modulation.
Authors: Soni A; School of Physical Sciences, Indian Institute of Technology Mandi, Kamand, Mandi 175005, Himachal Pradesh, India. suman@iitmandi.ac.in.; Advanced Materials Research Centre, Indian Institute of Technology Mandi, Kamand, Mandi 175005, Himachal Pradesh, India.; Department of Chemistry, Emory University, Atlanta, Georgia 30322, USA., Kamath NS; School of Physical Sciences, Indian Institute of Technology Mandi, Kamand, Mandi 175005, Himachal Pradesh, India. suman@iitmandi.ac.in.; Advanced Materials Research Centre, Indian Institute of Technology Mandi, Kamand, Mandi 175005, Himachal Pradesh, India., Is F; Institute of Nano Science and Technology, Knowledge City, Sector 81, Mohali 140306, India., Shen YY; Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan., Chang WH; Department of Electrophysics, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan.; Research Center for Applied Sciences, Academia Sinica, Nankang, Taipei 11529, Taiwan., De Sarkar A; Institute of Nano Science and Technology, Knowledge City, Sector 81, Mohali 140306, India., Pal SK; School of Physical Sciences, Indian Institute of Technology Mandi, Kamand, Mandi 175005, Himachal Pradesh, India. suman@iitmandi.ac.in.; Advanced Materials Research Centre, Indian Institute of Technology Mandi, Kamand, Mandi 175005, Himachal Pradesh, India.
Source: Nanoscale [Nanoscale] 2025 Nov 13; Vol. 17 (44), pp. 25727-25739. Date of Electronic Publication: 2025 Nov 13.
Publication Type: Journal Article
Journal Info: Publisher: RSC Pub Country of Publication: England NLM ID: 101525249 Publication Model: Electronic Cited Medium: Internet ISSN: 2040-3372 (Electronic) Linking ISSN: 20403364 NLM ISO Abbreviation: Nanoscale Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:2040-3372
DOI:10.1039/d5nr02938d