Magnetic Resonance Imaging Monitoring of the Safety of Repeated Low-Intensity Focused Ultrasound Exposure at Three Brain Locations.

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Bibliographic Details
Title: Magnetic Resonance Imaging Monitoring of the Safety of Repeated Low-Intensity Focused Ultrasound Exposure at Three Brain Locations.
Authors: Phipps MA; Department of Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN, USA; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, TN, USA., Mishra A; Department of Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN, USA; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, TN, USA., Donovan CL; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, TN, USA., Newton AT; Department of Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN, USA; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, TN, USA., McKnight CD; Department of Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN, USA., Dockum AQ; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, TN, USA; Department of Biomedical Engineering, Vanderbilt University, Nashville, TN, USA., Sigona MK; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, TN, USA; Department of Biomedical Engineering, Vanderbilt University, Nashville, TN, USA., Yang PF; Department of Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN, USA; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, TN, USA., Caskey CF; Department of Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN, USA; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, TN, USA; Department of Biomedical Engineering, Vanderbilt University, Nashville, TN, USA., Chen LM; Department of Radiology and Radiological Sciences, Vanderbilt University Medical Center, Nashville, TN, USA; Vanderbilt University Institute of Imaging Science, Vanderbilt University Medical Center, Nashville, TN, USA; Department of Biomedical Engineering, Vanderbilt University, Nashville, TN, USA. Electronic address: limin.chen@vanderbilt.edu.
Source: Neuromodulation : journal of the International Neuromodulation Society [Neuromodulation] 2026 Feb; Vol. 29 (2), pp. 243-254. Date of Electronic Publication: 2025 Nov 01.
Publication Type: Journal Article
Journal Info: Publisher: Elsevier Country of Publication: United States NLM ID: 9804159 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1525-1403 (Electronic) Linking ISSN: 10947159 NLM ISO Abbreviation: Neuromodulation Subsets: MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:1525-1403
DOI:10.1016/j.neurom.2025.09.313