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Secondary electron topographical contrast formation in scanning transmission electron microscopy.

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Bibliographic Details
Title: Secondary electron topographical contrast formation in scanning transmission electron microscopy.
Authors: Vlasov E; EMAT and NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp, 2020, Belgium., Heyvaert W; EMAT and NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp, 2020, Belgium., Stoops T; EMAT and NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp, 2020, Belgium., Van Aert S; EMAT and NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp, 2020, Belgium., Verbeeck J; EMAT and NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp, 2020, Belgium., Bals S; EMAT and NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp, 2020, Belgium. Electronic address: sara.bals@uantwerpen.be.
Source: Ultramicroscopy [Ultramicroscopy] 2026 Feb; Vol. 280, pp. 114278. Date of Electronic Publication: 2025 Nov 11.
Publication Type: Journal Article
Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1879-2723 (Electronic) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:1879-2723
DOI:10.1016/j.ultramic.2025.114278