APA (7th ed.) Citation

E, V., W, H., T, S., S, V. A., J, V., & S, B. (2026). Secondary electron topographical contrast formation in scanning transmission electron microscopy. Ultramicroscopy, 280, 114278. https://doi.org/10.1016/j.ultramic.2025.114278

Chicago Style (17th ed.) Citation

E, Vlasov, Heyvaert W, Stoops T, Van Aert S, Verbeeck J, and Bals S. "Secondary Electron Topographical Contrast Formation in Scanning Transmission Electron Microscopy." Ultramicroscopy 280 (2026): 114278. https://doi.org/10.1016/j.ultramic.2025.114278.

MLA (9th ed.) Citation

E, Vlasov, et al. "Secondary Electron Topographical Contrast Formation in Scanning Transmission Electron Microscopy." Ultramicroscopy, vol. 280, 2026, p. 114278, https://doi.org/10.1016/j.ultramic.2025.114278.