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Secondary electron topographical contrast formation in scanning transmission electron microscopy.

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Title: Secondary electron topographical contrast formation in scanning transmission electron microscopy.
Authors: Vlasov E; EMAT and NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp, 2020, Belgium., Heyvaert W; EMAT and NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp, 2020, Belgium., Stoops T; EMAT and NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp, 2020, Belgium., Van Aert S; EMAT and NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp, 2020, Belgium., Verbeeck J; EMAT and NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp, 2020, Belgium., Bals S; EMAT and NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp, 2020, Belgium. Electronic address: sara.bals@uantwerpen.be.
Source: Ultramicroscopy [Ultramicroscopy] 2026 Feb; Vol. 280, pp. 114278. Date of Electronic Publication: 2025 Nov 11.
Publication Type: Journal Article
Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1879-2723 (Electronic) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: Secondary electron topographical contrast formation in scanning transmission electron microscopy.
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  Data: <searchLink fieldCode="AU" term="%22Vlasov+E%22">Vlasov E</searchLink>; EMAT and NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp, 2020, Belgium.<br /><searchLink fieldCode="AU" term="%22Heyvaert+W%22">Heyvaert W</searchLink>; EMAT and NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp, 2020, Belgium.<br /><searchLink fieldCode="AU" term="%22Stoops+T%22">Stoops T</searchLink>; EMAT and NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp, 2020, Belgium.<br /><searchLink fieldCode="AU" term="%22Van+Aert+S%22">Van Aert S</searchLink>; EMAT and NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp, 2020, Belgium.<br /><searchLink fieldCode="AU" term="%22Verbeeck+J%22">Verbeeck J</searchLink>; EMAT and NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp, 2020, Belgium.<br /><searchLink fieldCode="AU" term="%22Bals+S%22">Bals S</searchLink>; EMAT and NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, Antwerp, 2020, Belgium. Electronic address: sara.bals@uantwerpen.be.
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  Data: <searchLink fieldCode="JN" term="%227513702%22">Ultramicroscopy</searchLink> [Ultramicroscopy] 2026 Feb; Vol. 280, pp. 114278. <i>Date of Electronic Publication: </i>2025 Nov 11.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Elsevier%22">Elsevier </searchLink><i>Country of Publication: </i>Netherlands <i>NLM ID: </i>7513702 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1879-2723 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2203043991%22">03043991 </searchLink><i>NLM ISO Abbreviation: </i>Ultramicroscopy <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
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        Value: 10.1016/j.ultramic.2025.114278
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              Text: 2026 Feb
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