Sapphire/silicon-substrate dependent magnetism of Er-substituted ZnO (ZnO: Er) thin film: x-ray absorption near edge structure (XANES) study.
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| Title: | Sapphire/silicon-substrate dependent magnetism of Er-substituted ZnO (ZnO: Er) thin film: x-ray absorption near edge structure (XANES) study. |
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| Authors: | Das S; Department of Physics, Faculty of Engineering and Technology (ITER), Siksha 'O' Anusandhan Deemed to be University, Bhubaneswar, 751 030, Odisha, India., Chen KH; Department of Physics, Tamkang University, Tamsui 251, Taipei, Taiwan., Chhotaray T; Department of Physics, Faculty of Engineering and Technology (ITER), Siksha 'O' Anusandhan Deemed to be University, Bhubaneswar, 751 030, Odisha, India., Lin WX; Department of Physics, Tamkang University, Tamsui 251, Taipei, Taiwan., Ghosh S; Department of Physics, Tamkang University, Tamsui 251, Taipei, Taiwan., Mishra DK; Department of Physics, Faculty of Engineering and Technology (ITER), Siksha 'O' Anusandhan Deemed to be University, Bhubaneswar, 751 030, Odisha, India., Ray SC; Department of Physics, Faculty of Engineering and Technology (ITER), Siksha 'O' Anusandhan Deemed to be University, Bhubaneswar, 751 030, Odisha, India. sekharchandraray@soa.ac.in.; Department of Physics, CSET, University of South Africa, Florida Science Campus, Private Bag X6, Christiaan de Wet and Pioneer Avenue, Florida Park, Florida, Johannesburg, 1710, South Africa. sekharchandraray@soa.ac.in., Pong WF; Department of Physics, Tamkang University, Tamsui 251, Taipei, Taiwan. wfpong@gms.tku.edu.tw. |
| Source: | Scientific reports [Sci Rep] 2025 Nov 20; Vol. 15 (1), pp. 41086. Date of Electronic Publication: 2025 Nov 20. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Electronic Cited Medium: Internet ISSN: 2045-2322 (Electronic) Linking ISSN: 20452322 NLM ISO Abbreviation: Sci Rep Subsets: MEDLINE; PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
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| ISSN: | 2045-2322 |
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| DOI: | 10.1038/s41598-025-25017-0 |
