Improving interfacial thermal conductivity by constructing covalent bond between Ga₂O₃ and SiC.

Saved in:
Bibliographic Details
Title: Improving interfacial thermal conductivity by constructing covalent bond between Ga₂O₃ and SiC.
Authors: Shen Y; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China.; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China., Qi X; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China., Li Y; School of Energy and Environmental Engineering, University of Science and Technology Beijing, Beijing, China., Guo Y; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China., Huang Q; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China., Dai W; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China. daiwen@nimte.ac.cn., Yuan Q; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China., Gu L; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China., Ding C; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China., Chen WJ; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China., Yang M; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China., Jia Z; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China., Lin CT; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China., Jiang N; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China., Sun F; School of Energy and Environmental Engineering, University of Science and Technology Beijing, Beijing, China., Zhang QJ; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China., Ma HP; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China. hpma@fudan.edu.cn.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China. hpma@fudan.edu.cn.; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China. hpma@fudan.edu.cn.
Source: Nature communications [Nat Commun] 2025 Nov 28; Vol. 16 (1), pp. 10723. Date of Electronic Publication: 2025 Nov 28.
Publication Type: Journal Article
Journal Info: Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
Full text is not displayed to guests.
FullText Links:
  – Type: pdflink
Text:
  Availability: 1
Header DbId: mdl
DbLabel: MEDLINE Ultimate
An: 41315318
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Improving interfacial thermal conductivity by constructing covalent bond between Ga₂O₃ and SiC.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Shen+Y%22">Shen Y</searchLink>; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China.; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China.<br /><searchLink fieldCode="AU" term="%22Qi+X%22">Qi X</searchLink>; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.<br /><searchLink fieldCode="AU" term="%22Li+Y%22">Li Y</searchLink>; School of Energy and Environmental Engineering, University of Science and Technology Beijing, Beijing, China.<br /><searchLink fieldCode="AU" term="%22Guo+Y%22">Guo Y</searchLink>; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.<br /><searchLink fieldCode="AU" term="%22Huang+Q%22">Huang Q</searchLink>; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.<br /><searchLink fieldCode="AU" term="%22Dai+W%22">Dai W</searchLink>; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China. daiwen@nimte.ac.cn.<br /><searchLink fieldCode="AU" term="%22Yuan+Q%22">Yuan Q</searchLink>; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China.<br /><searchLink fieldCode="AU" term="%22Gu+L%22">Gu L</searchLink>; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China.<br /><searchLink fieldCode="AU" term="%22Ding+C%22">Ding C</searchLink>; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.<br /><searchLink fieldCode="AU" term="%22Chen+WJ%22">Chen WJ</searchLink>; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China.<br /><searchLink fieldCode="AU" term="%22Yang+M%22">Yang M</searchLink>; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China.<br /><searchLink fieldCode="AU" term="%22Jia+Z%22">Jia Z</searchLink>; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China.<br /><searchLink fieldCode="AU" term="%22Lin+CT%22">Lin CT</searchLink>; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China.<br /><searchLink fieldCode="AU" term="%22Jiang+N%22">Jiang N</searchLink>; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China.<br /><searchLink fieldCode="AU" term="%22Sun+F%22">Sun F</searchLink>; School of Energy and Environmental Engineering, University of Science and Technology Beijing, Beijing, China.<br /><searchLink fieldCode="AU" term="%22Zhang+QJ%22">Zhang QJ</searchLink>; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China.<br /><searchLink fieldCode="AU" term="%22Ma+HP%22">Ma HP</searchLink>; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China. hpma@fudan.edu.cn.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China. hpma@fudan.edu.cn.; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China. hpma@fudan.edu.cn.
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22101528555%22">Nature communications</searchLink> [Nat Commun] 2025 Nov 28; Vol. 16 (1), pp. 10723. <i>Date of Electronic Publication: </i>2025 Nov 28.
– Name: TypePub
  Label: Publication Type
  Group: TypPub
  Data: Journal Article
– Name: TitleSource
  Label: Journal Info
  Group: Src
  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Nature+Pub%2E+Group%22">Nature Pub. Group </searchLink><i>Country of Publication: </i>England <i>NLM ID: </i>101528555 <i>Publication Model: </i>Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>2041-1723 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2220411723%22">20411723 </searchLink><i>NLM ISO Abbreviation: </i>Nat Commun <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=mdl&AN=41315318
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1038/s41467-025-65750-8
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        StartPage: 10723
    Titles:
      – TitleFull: Improving interfacial thermal conductivity by constructing covalent bond between Ga₂O₃ and SiC.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Shen Y
      – PersonEntity:
          Name:
            NameFull: Qi X
      – PersonEntity:
          Name:
            NameFull: Li Y
      – PersonEntity:
          Name:
            NameFull: Guo Y
      – PersonEntity:
          Name:
            NameFull: Huang Q
      – PersonEntity:
          Name:
            NameFull: Dai W
      – PersonEntity:
          Name:
            NameFull: Yuan Q
      – PersonEntity:
          Name:
            NameFull: Gu L
      – PersonEntity:
          Name:
            NameFull: Ding C
      – PersonEntity:
          Name:
            NameFull: Chen WJ
      – PersonEntity:
          Name:
            NameFull: Yang M
      – PersonEntity:
          Name:
            NameFull: Jia Z
      – PersonEntity:
          Name:
            NameFull: Lin CT
      – PersonEntity:
          Name:
            NameFull: Jiang N
      – PersonEntity:
          Name:
            NameFull: Sun F
      – PersonEntity:
          Name:
            NameFull: Zhang QJ
      – PersonEntity:
          Name:
            NameFull: Ma HP
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 28
              M: 11
              Text: 2025 Nov 28
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-electronic
              Value: 2041-1723
          Numbering:
            – Type: volume
              Value: 16
            – Type: issue
              Value: 1
          Titles:
            – TitleFull: Nature communications
              Type: main
ResultId 1