Improving interfacial thermal conductivity by constructing covalent bond between Ga₂O₃ and SiC.
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| Title: | Improving interfacial thermal conductivity by constructing covalent bond between Ga₂O₃ and SiC. |
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| Authors: | Shen Y; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China.; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China., Qi X; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China., Li Y; School of Energy and Environmental Engineering, University of Science and Technology Beijing, Beijing, China., Guo Y; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China., Huang Q; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China., Dai W; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China. daiwen@nimte.ac.cn., Yuan Q; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China., Gu L; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China., Ding C; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China., Chen WJ; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China., Yang M; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China., Jia Z; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China., Lin CT; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China., Jiang N; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China., Sun F; School of Energy and Environmental Engineering, University of Science and Technology Beijing, Beijing, China., Zhang QJ; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China., Ma HP; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China. hpma@fudan.edu.cn.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China. hpma@fudan.edu.cn.; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China. hpma@fudan.edu.cn. |
| Source: | Nature communications [Nat Commun] 2025 Nov 28; Vol. 16 (1), pp. 10723. Date of Electronic Publication: 2025 Nov 28. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: MEDLINE; PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
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| Header | DbId: mdl DbLabel: MEDLINE Ultimate An: 41315318 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Improving interfacial thermal conductivity by constructing covalent bond between Ga₂O₃ and SiC. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Shen+Y%22">Shen Y</searchLink>; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China.; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China.<br /><searchLink fieldCode="AU" term="%22Qi+X%22">Qi X</searchLink>; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.<br /><searchLink fieldCode="AU" term="%22Li+Y%22">Li Y</searchLink>; School of Energy and Environmental Engineering, University of Science and Technology Beijing, Beijing, China.<br /><searchLink fieldCode="AU" term="%22Guo+Y%22">Guo Y</searchLink>; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.<br /><searchLink fieldCode="AU" term="%22Huang+Q%22">Huang Q</searchLink>; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.<br /><searchLink fieldCode="AU" term="%22Dai+W%22">Dai W</searchLink>; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China. daiwen@nimte.ac.cn.<br /><searchLink fieldCode="AU" term="%22Yuan+Q%22">Yuan Q</searchLink>; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China.<br /><searchLink fieldCode="AU" term="%22Gu+L%22">Gu L</searchLink>; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China.<br /><searchLink fieldCode="AU" term="%22Ding+C%22">Ding C</searchLink>; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.<br /><searchLink fieldCode="AU" term="%22Chen+WJ%22">Chen WJ</searchLink>; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China.<br /><searchLink fieldCode="AU" term="%22Yang+M%22">Yang M</searchLink>; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China.<br /><searchLink fieldCode="AU" term="%22Jia+Z%22">Jia Z</searchLink>; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China.<br /><searchLink fieldCode="AU" term="%22Lin+CT%22">Lin CT</searchLink>; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China.<br /><searchLink fieldCode="AU" term="%22Jiang+N%22">Jiang N</searchLink>; State Key Laboratory of Advanced Marine Materials, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Ningbo, China.<br /><searchLink fieldCode="AU" term="%22Sun+F%22">Sun F</searchLink>; School of Energy and Environmental Engineering, University of Science and Technology Beijing, Beijing, China.<br /><searchLink fieldCode="AU" term="%22Zhang+QJ%22">Zhang QJ</searchLink>; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China.; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China.<br /><searchLink fieldCode="AU" term="%22Ma+HP%22">Ma HP</searchLink>; Institute of Wide Bandgap Semiconductors and Future Lighting, College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China. hpma@fudan.edu.cn.; Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University, Shanghai, China. hpma@fudan.edu.cn.; Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo, Zhejiang, China. hpma@fudan.edu.cn. – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22101528555%22">Nature communications</searchLink> [Nat Commun] 2025 Nov 28; Vol. 16 (1), pp. 10723. <i>Date of Electronic Publication: </i>2025 Nov 28. – Name: TypePub Label: Publication Type Group: TypPub Data: Journal Article – Name: TitleSource Label: Journal Info Group: Src Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Nature+Pub%2E+Group%22">Nature Pub. Group </searchLink><i>Country of Publication: </i>England <i>NLM ID: </i>101528555 <i>Publication Model: </i>Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>2041-1723 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2220411723%22">20411723 </searchLink><i>NLM ISO Abbreviation: </i>Nat Commun <i>Subsets: </i>MEDLINE; PubMed not MEDLINE |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1038/s41467-025-65750-8 Languages: – Code: eng Text: English PhysicalDescription: Pagination: StartPage: 10723 Titles: – TitleFull: Improving interfacial thermal conductivity by constructing covalent bond between Ga₂O₃ and SiC. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Shen Y – PersonEntity: Name: NameFull: Qi X – PersonEntity: Name: NameFull: Li Y – PersonEntity: Name: NameFull: Guo Y – PersonEntity: Name: NameFull: Huang Q – PersonEntity: Name: NameFull: Dai W – PersonEntity: Name: NameFull: Yuan Q – PersonEntity: Name: NameFull: Gu L – PersonEntity: Name: NameFull: Ding C – PersonEntity: Name: NameFull: Chen WJ – PersonEntity: Name: NameFull: Yang M – PersonEntity: Name: NameFull: Jia Z – PersonEntity: Name: NameFull: Lin CT – PersonEntity: Name: NameFull: Jiang N – PersonEntity: Name: NameFull: Sun F – PersonEntity: Name: NameFull: Zhang QJ – PersonEntity: Name: NameFull: Ma HP IsPartOfRelationships: – BibEntity: Dates: – D: 28 M: 11 Text: 2025 Nov 28 Type: published Y: 2025 Identifiers: – Type: issn-electronic Value: 2041-1723 Numbering: – Type: volume Value: 16 – Type: issue Value: 1 Titles: – TitleFull: Nature communications Type: main |
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