| Authors: |
Capocasa F; Instrumentation Department, Brookhaven National Laboratory, Upton, NY, 11973, USA., Rumaiz AK; NSLS II, Brookhaven National Laboratory, Upton, NY, 11973, USA. rumaiz@bnl.gov., Weiland C; National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA., Goul R; Department of Physics and Astronomy, University of Kansas, Lawrence, KS, 66045, USA., Marshall A; Department of Physics and Astronomy, University of Kansas, Lawrence, KS, 66045, USA., Harding I; Instrumentation Department, Brookhaven National Laboratory, Upton, NY, 11973, USA., Ozbay A; TUBITAK National Metrology Institute, Kocaeli, 41470, Turkey., Kuczewski AJ; NSLS II, Brookhaven National Laboratory, Upton, NY, 11973, USA., Karmakar S; Electrical and Computer Engineering Technology, Farmingdale State College, Farmingdale, NY, 11735, USA., Boukhicha M; Instrumentation Department, Brookhaven National Laboratory, Upton, NY, 11973, USA., Miryala S; Instrumentation Department, Brookhaven National Laboratory, Upton, NY, 11973, USA., Carini GA; Instrumentation Department, Brookhaven National Laboratory, Upton, NY, 11973, USA., Siddons DP; NSLS II, Brookhaven National Laboratory, Upton, NY, 11973, USA., Woicik JC; National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA., Wu JZ; Department of Physics and Astronomy, University of Kansas, Lawrence, KS, 66045, USA. |
