View in EDS

Tracking oxygen vacancy migration in memristor devices using operando hard X-ray photoelectron spectroscopy.

Saved in:
Bibliographic Details
Title: Tracking oxygen vacancy migration in memristor devices using operando hard X-ray photoelectron spectroscopy.
Authors: Capocasa F; Instrumentation Department, Brookhaven National Laboratory, Upton, NY, 11973, USA., Rumaiz AK; NSLS II, Brookhaven National Laboratory, Upton, NY, 11973, USA. rumaiz@bnl.gov., Weiland C; National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA., Goul R; Department of Physics and Astronomy, University of Kansas, Lawrence, KS, 66045, USA., Marshall A; Department of Physics and Astronomy, University of Kansas, Lawrence, KS, 66045, USA., Harding I; Instrumentation Department, Brookhaven National Laboratory, Upton, NY, 11973, USA., Ozbay A; TUBITAK National Metrology Institute, Kocaeli, 41470, Turkey., Kuczewski AJ; NSLS II, Brookhaven National Laboratory, Upton, NY, 11973, USA., Karmakar S; Electrical and Computer Engineering Technology, Farmingdale State College, Farmingdale, NY, 11735, USA., Boukhicha M; Instrumentation Department, Brookhaven National Laboratory, Upton, NY, 11973, USA., Miryala S; Instrumentation Department, Brookhaven National Laboratory, Upton, NY, 11973, USA., Carini GA; Instrumentation Department, Brookhaven National Laboratory, Upton, NY, 11973, USA., Siddons DP; NSLS II, Brookhaven National Laboratory, Upton, NY, 11973, USA., Woicik JC; National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA., Wu JZ; Department of Physics and Astronomy, University of Kansas, Lawrence, KS, 66045, USA.
Source: Scientific reports [Sci Rep] 2025 Dec 02; Vol. 16 (1), pp. 755. Date of Electronic Publication: 2025 Dec 02.
Publication Type: Journal Article
Journal Info: Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Electronic Cited Medium: Internet ISSN: 2045-2322 (Electronic) Linking ISSN: 20452322 NLM ISO Abbreviation: Sci Rep Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
FullText Text:
  Availability: 0
Header DbId: mdl
DbLabel: MEDLINE Ultimate
An: 41331027
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Tracking oxygen vacancy migration in memristor devices using operando hard X-ray photoelectron spectroscopy.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Capocasa+F%22">Capocasa F</searchLink>; Instrumentation Department, Brookhaven National Laboratory, Upton, NY, 11973, USA.<br /><searchLink fieldCode="AU" term="%22Rumaiz+AK%22">Rumaiz AK</searchLink>; NSLS II, Brookhaven National Laboratory, Upton, NY, 11973, USA. rumaiz@bnl.gov.<br /><searchLink fieldCode="AU" term="%22Weiland+C%22">Weiland C</searchLink>; National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA.<br /><searchLink fieldCode="AU" term="%22Goul+R%22">Goul R</searchLink>; Department of Physics and Astronomy, University of Kansas, Lawrence, KS, 66045, USA.<br /><searchLink fieldCode="AU" term="%22Marshall+A%22">Marshall A</searchLink>; Department of Physics and Astronomy, University of Kansas, Lawrence, KS, 66045, USA.<br /><searchLink fieldCode="AU" term="%22Harding+I%22">Harding I</searchLink>; Instrumentation Department, Brookhaven National Laboratory, Upton, NY, 11973, USA.<br /><searchLink fieldCode="AU" term="%22Ozbay+A%22">Ozbay A</searchLink>; TUBITAK National Metrology Institute, Kocaeli, 41470, Turkey.<br /><searchLink fieldCode="AU" term="%22Kuczewski+AJ%22">Kuczewski AJ</searchLink>; NSLS II, Brookhaven National Laboratory, Upton, NY, 11973, USA.<br /><searchLink fieldCode="AU" term="%22Karmakar+S%22">Karmakar S</searchLink>; Electrical and Computer Engineering Technology, Farmingdale State College, Farmingdale, NY, 11735, USA.<br /><searchLink fieldCode="AU" term="%22Boukhicha+M%22">Boukhicha M</searchLink>; Instrumentation Department, Brookhaven National Laboratory, Upton, NY, 11973, USA.<br /><searchLink fieldCode="AU" term="%22Miryala+S%22">Miryala S</searchLink>; Instrumentation Department, Brookhaven National Laboratory, Upton, NY, 11973, USA.<br /><searchLink fieldCode="AU" term="%22Carini+GA%22">Carini GA</searchLink>; Instrumentation Department, Brookhaven National Laboratory, Upton, NY, 11973, USA.<br /><searchLink fieldCode="AU" term="%22Siddons+DP%22">Siddons DP</searchLink>; NSLS II, Brookhaven National Laboratory, Upton, NY, 11973, USA.<br /><searchLink fieldCode="AU" term="%22Woicik+JC%22">Woicik JC</searchLink>; National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA.<br /><searchLink fieldCode="AU" term="%22Wu+JZ%22">Wu JZ</searchLink>; Department of Physics and Astronomy, University of Kansas, Lawrence, KS, 66045, USA.
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22101563288%22">Scientific reports</searchLink> [Sci Rep] 2025 Dec 02; Vol. 16 (1), pp. 755. <i>Date of Electronic Publication: </i>2025 Dec 02.
– Name: TypePub
  Label: Publication Type
  Group: TypPub
  Data: Journal Article
– Name: TitleSource
  Label: Journal Info
  Group: Src
  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Nature+Publishing+Group%22">Nature Publishing Group </searchLink><i>Country of Publication: </i>England <i>NLM ID: </i>101563288 <i>Publication Model: </i>Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>2045-2322 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2220452322%22">20452322 </searchLink><i>NLM ISO Abbreviation: </i>Sci Rep <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=mdl&AN=41331027
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1038/s41598-025-30246-4
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        StartPage: 755
    Titles:
      – TitleFull: Tracking oxygen vacancy migration in memristor devices using operando hard X-ray photoelectron spectroscopy.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Capocasa F
      – PersonEntity:
          Name:
            NameFull: Rumaiz AK
      – PersonEntity:
          Name:
            NameFull: Weiland C
      – PersonEntity:
          Name:
            NameFull: Goul R
      – PersonEntity:
          Name:
            NameFull: Marshall A
      – PersonEntity:
          Name:
            NameFull: Harding I
      – PersonEntity:
          Name:
            NameFull: Ozbay A
      – PersonEntity:
          Name:
            NameFull: Kuczewski AJ
      – PersonEntity:
          Name:
            NameFull: Karmakar S
      – PersonEntity:
          Name:
            NameFull: Boukhicha M
      – PersonEntity:
          Name:
            NameFull: Miryala S
      – PersonEntity:
          Name:
            NameFull: Carini GA
      – PersonEntity:
          Name:
            NameFull: Siddons DP
      – PersonEntity:
          Name:
            NameFull: Woicik JC
      – PersonEntity:
          Name:
            NameFull: Wu JZ
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 02
              M: 12
              Text: 2025 Dec 02
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-electronic
              Value: 2045-2322
          Numbering:
            – Type: volume
              Value: 16
            – Type: issue
              Value: 1
          Titles:
            – TitleFull: Scientific reports
              Type: main
ResultId 1