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In situ high temperature X-ray diffraction and dilatometric analysis of CGO-Cu composites for solid oxide devices.

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Bibliographic Details
Title: In situ high temperature X-ray diffraction and dilatometric analysis of CGO-Cu composites for solid oxide devices.
Authors: Balaguer M; Instituto de Tecnología Química (ITQ), Consejo Superior de Investigaciones Científicas-Universitat Politècnica de València, 46022, Valencia, Spain., Fabuel M; Instituto de Tecnología Química (ITQ), Consejo Superior de Investigaciones Científicas-Universitat Politècnica de València, 46022, Valencia, Spain., Kriele A; German Engineering Materials Science Centre (GEMS) at Heinz Maier-Leibnitz Zentrum (MLZ), Helmholtz-Zentrum Hereon, 85748, Garching, Germany., Stark A; Institute of Materials Physics, Helmholtz-Zentrum Hereon, Max-Planck-Strasse 1, 21502, Geesthacht, Germany., Serra JM; Instituto de Tecnología Química (ITQ), Consejo Superior de Investigaciones Científicas-Universitat Politècnica de València, 46022, Valencia, Spain., Solís C; German Engineering Materials Science Centre (GEMS) at Heinz Maier-Leibnitz Zentrum (MLZ), Helmholtz-Zentrum Hereon, 85748, Garching, Germany. cecilia.solis@hereon.de.
Source: Scientific reports [Sci Rep] 2026 Jan 10; Vol. 16 (1), pp. 1315. Date of Electronic Publication: 2026 Jan 10.
Publication Type: Journal Article
Journal Info: Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Electronic Cited Medium: Internet ISSN: 2045-2322 (Electronic) Linking ISSN: 20452322 NLM ISO Abbreviation: Sci Rep Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:2045-2322
DOI:10.1038/s41598-026-35161-w