| Authors: |
Erdogan RT; Department of Precision and Microsystems Engineering, Faculty of Mechanical Engineering, Delft University of Technology, Delft, The Netherlands., Lopez-Rodriguez B; Department of Imaging Physics (ImPhys), Faculty of Applied Sciences, Delft University of Technology, Delft, The Netherlands., Westerveld WJ; Department of Precision and Microsystems Engineering, Faculty of Mechanical Engineering, Delft University of Technology, Delft, The Netherlands., Iskander-Rizk S; Department of Precision and Microsystems Engineering, Faculty of Mechanical Engineering, Delft University of Technology, Delft, The Netherlands., Verbiest GJ; Department of Precision and Microsystems Engineering, Faculty of Mechanical Engineering, Delft University of Technology, Delft, The Netherlands., Zadeh IE; Department of Imaging Physics (ImPhys), Faculty of Applied Sciences, Delft University of Technology, Delft, The Netherlands., Steeneken PG; Department of Precision and Microsystems Engineering, Faculty of Mechanical Engineering, Delft University of Technology, Delft, The Netherlands. |
