| Authors: |
Wang Z; Strait Institute of Flexible Electronics (SIFE, Future Technologies), Fujian Key Laboratory of Flexible Electronics, Fujian Normal University and Strait Laboratory of Flexible Electronics (SLoFE), Fuzhou, 350117, China. ifehfdu@fjnu.edu.cn., Gu J; Strait Institute of Flexible Electronics (SIFE, Future Technologies), Fujian Key Laboratory of Flexible Electronics, Fujian Normal University and Strait Laboratory of Flexible Electronics (SLoFE), Fuzhou, 350117, China. ifehfdu@fjnu.edu.cn., Leng Y; Strait Institute of Flexible Electronics (SIFE, Future Technologies), Fujian Key Laboratory of Flexible Electronics, Fujian Normal University and Strait Laboratory of Flexible Electronics (SLoFE), Fuzhou, 350117, China. ifehfdu@fjnu.edu.cn., Cheng L; Strait Institute of Flexible Electronics (SIFE, Future Technologies), Fujian Key Laboratory of Flexible Electronics, Fujian Normal University and Strait Laboratory of Flexible Electronics (SLoFE), Fuzhou, 350117, China. ifehfdu@fjnu.edu.cn., Hei YY; Department of Pharmacy, Fuzhou University Affiliated Provincial Hospital, Fuzhou, 350001, China. yuanyuanhei@outlook.com., Chen C; College of Chemistry & Materials Science, Fujian Normal University, Fuzhou, 350117, China., Lin R; College of Chemistry & Materials Science, Fujian Normal University, Fuzhou, 350117, China., Pu Z; College of Chemistry & Materials Science, Fujian Normal University, Fuzhou, 350117, China., Du H; Strait Institute of Flexible Electronics (SIFE, Future Technologies), Fujian Key Laboratory of Flexible Electronics, Fujian Normal University and Strait Laboratory of Flexible Electronics (SLoFE), Fuzhou, 350117, China. ifehfdu@fjnu.edu.cn., Lin L; Strait Institute of Flexible Electronics (SIFE, Future Technologies), Fujian Key Laboratory of Flexible Electronics, Fujian Normal University and Strait Laboratory of Flexible Electronics (SLoFE), Fuzhou, 350117, China. ifehfdu@fjnu.edu.cn. |
