A Study of the Avalanche Multiplication and Excess Noise in Al x In1-x AsγSb1‑ γ Avalanche Photodiodes Lattice-Matched to GaSb.
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| Title: | A Study of the Avalanche Multiplication and Excess Noise in Al |
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| Authors: | Jin X; Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield S1 3JD, U.K., Zhou W; Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China.; China Electric Power Research Institute, Beijing 102209, China., Zhao Y; Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield S1 3JD, U.K., Tian Q; Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield S1 3JD, U.K., Yi X; Institute of Photonics and Quantum Sciences, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh EH14 4AS, U.K., Tao X; Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield S1 3JD, U.K., Craig A; Department of Physics, University of Lancaster, Lancaster LA1 4WA, U.K., Modak M; Institute of Photonics and Quantum Sciences, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh EH14 4AS, U.K., Marshall A; Department of Physics, University of Lancaster, Lancaster LA1 4WA, U.K., Xu Y; Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China., Wang G; Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China., David JPR; Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield S1 3JD, U.K., Buller GS; Institute of Photonics and Quantum Sciences, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh EH14 4AS, U.K. |
| Source: | ACS photonics [ACS Photonics] 2026 Feb 13; Vol. 13 (5), pp. 1275-1283. Date of Electronic Publication: 2026 Feb 13 (Print Publication: 2026). |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: American Chemical Society Country of Publication: United States NLM ID: 101634366 Publication Model: eCollection Cited Medium: Print ISSN: 2330-4022 (Print) Linking ISSN: 23304022 NLM ISO Abbreviation: ACS Photonics Subsets: PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
| FullText | Text: Availability: 0 |
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| Header | DbId: mdl DbLabel: MEDLINE Ultimate An: 41800268 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: A Study of the Avalanche Multiplication and Excess Noise in Al <subscript>x</subscript> In<subscript>1-x</subscript> As<subscript>γ</subscript>Sb<subscript>1‑</subscript> <subscript>γ</subscript> Avalanche Photodiodes Lattice-Matched to GaSb. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Jin+X%22">Jin X</searchLink>; Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield S1 3JD, U.K.<br /><searchLink fieldCode="AU" term="%22Zhou+W%22">Zhou W</searchLink>; Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China.; China Electric Power Research Institute, Beijing 102209, China.<br /><searchLink fieldCode="AU" term="%22Zhao+Y%22">Zhao Y</searchLink>; Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield S1 3JD, U.K.<br /><searchLink fieldCode="AU" term="%22Tian+Q%22">Tian Q</searchLink>; Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield S1 3JD, U.K.<br /><searchLink fieldCode="AU" term="%22Yi+X%22">Yi X</searchLink>; Institute of Photonics and Quantum Sciences, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh EH14 4AS, U.K.<br /><searchLink fieldCode="AU" term="%22Tao+X%22">Tao X</searchLink>; Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield S1 3JD, U.K.<br /><searchLink fieldCode="AU" term="%22Craig+A%22">Craig A</searchLink>; Department of Physics, University of Lancaster, Lancaster LA1 4WA, U.K.<br /><searchLink fieldCode="AU" term="%22Modak+M%22">Modak M</searchLink>; Institute of Photonics and Quantum Sciences, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh EH14 4AS, U.K.<br /><searchLink fieldCode="AU" term="%22Marshall+A%22">Marshall A</searchLink>; Department of Physics, University of Lancaster, Lancaster LA1 4WA, U.K.<br /><searchLink fieldCode="AU" term="%22Xu+Y%22">Xu Y</searchLink>; Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China.<br /><searchLink fieldCode="AU" term="%22Wang+G%22">Wang G</searchLink>; Key Laboratory of Optoelectronic Materials and Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China.<br /><searchLink fieldCode="AU" term="%22David+JPR%22">David JPR</searchLink>; Department of Electronic and Electrical Engineering, University of Sheffield, Sheffield S1 3JD, U.K.<br /><searchLink fieldCode="AU" term="%22Buller+GS%22">Buller GS</searchLink>; Institute of Photonics and Quantum Sciences, School of Engineering and Physical Sciences, Heriot-Watt University, Edinburgh EH14 4AS, U.K. – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22101634366%22">ACS photonics</searchLink> [ACS Photonics] 2026 Feb 13; Vol. 13 (5), pp. 1275-1283. <i>Date of Electronic Publication: </i>2026 Feb 13 (<i>Print Publication: </i>2026). – Name: TypePub Label: Publication Type Group: TypPub Data: Journal Article – Name: TitleSource Label: Journal Info Group: Src Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22American+Chemical+Society%22">American Chemical Society </searchLink><i>Country of Publication: </i>United States <i>NLM ID: </i>101634366 <i>Publication Model: </i>eCollection <i>Cited Medium: </i>Print <i>ISSN: </i>2330-4022 (Print) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2223304022%22">23304022 </searchLink><i>NLM ISO Abbreviation: </i>ACS Photonics <i>Subsets: </i>PubMed not MEDLINE |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1021/acsphotonics.5c02166 Languages: – Code: eng Text: English PhysicalDescription: Pagination: StartPage: 1275 Titles: – TitleFull: A Study of the Avalanche Multiplication and Excess Noise in Al x In1-x AsγSb1‑ γ Avalanche Photodiodes Lattice-Matched to GaSb. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Jin X – PersonEntity: Name: NameFull: Zhou W – PersonEntity: Name: NameFull: Zhao Y – PersonEntity: Name: NameFull: Tian Q – PersonEntity: Name: NameFull: Yi X – PersonEntity: Name: NameFull: Tao X – PersonEntity: Name: NameFull: Craig A – PersonEntity: Name: NameFull: Modak M – PersonEntity: Name: NameFull: Marshall A – PersonEntity: Name: NameFull: Xu Y – PersonEntity: Name: NameFull: Wang G – PersonEntity: Name: NameFull: David JPR – PersonEntity: Name: NameFull: Buller GS IsPartOfRelationships: – BibEntity: Dates: – D: 13 M: 02 Text: 2026 Feb 13 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 2330-4022 Numbering: – Type: volume Value: 13 – Type: issue Value: 5 Titles: – TitleFull: ACS photonics Type: main |
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