| Authors: |
Hervé M; Univ Rennes, CNRS, Institut de Physique de Rennes (IPR), UMR 6251, Rennes, France. marius.herve@univ-rennes.fr.; CNRS, Univ Rennes, Dynamical Control of Materials Laboratory (DYNACOM)-IRL 2015, The University of Tokyo, Tokyo, Japan. marius.herve@univ-rennes.fr., Privault G; Univ Rennes, CNRS, Institut de Physique de Rennes (IPR), UMR 6251, Rennes, France.; CNRS, Univ Rennes, Dynamical Control of Materials Laboratory (DYNACOM)-IRL 2015, The University of Tokyo, Tokyo, Japan., Zerdane S; Paul Scherrer Institute, Villigen, Switzerland., Akagi S; Department of Materials Science, Institute of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Japan., Gee LB; Linac Coherent Light Source, SLAC National Accelerator Laboratory, Menlo Park, CA, USA., Ribson RD; Linac Coherent Light Source, SLAC National Accelerator Laboratory, Menlo Park, CA, USA., Chollet M; Linac Coherent Light Source, SLAC National Accelerator Laboratory, Menlo Park, CA, USA., Ohkoshi SI; CNRS, Univ Rennes, Dynamical Control of Materials Laboratory (DYNACOM)-IRL 2015, The University of Tokyo, Tokyo, Japan.; Department of Chemistry, School of Science, The University of Tokyo, Bunkyo-ku, Tokyo, Japan., Tokoro H; CNRS, Univ Rennes, Dynamical Control of Materials Laboratory (DYNACOM)-IRL 2015, The University of Tokyo, Tokyo, Japan.; Department of Materials Science, Institute of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Japan., Cammarata M; ESRF-The European Synchrotron, Grenoble, France. marco.cammarata@esrf.fr., Collet E; Univ Rennes, CNRS, Institut de Physique de Rennes (IPR), UMR 6251, Rennes, France. eric.collet@univ-rennes.fr.; CNRS, Univ Rennes, Dynamical Control of Materials Laboratory (DYNACOM)-IRL 2015, The University of Tokyo, Tokyo, Japan. eric.collet@univ-rennes.fr.; Institut Universitaire de France (IUF), Paris, France. eric.collet@univ-rennes.fr. |
