| Authors: |
Deb D; HHMI Janelia Research Campus, Ashburn VA, USA., Both GJ; HHMI Janelia Research Campus, Ashburn VA, USA., Bezzam E; Audiovisual Communications Laboratory, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland., Kohli A; Department of Electrical Engineering and Computer Sciences, UC Berkeley, Berkeley CA, USA., Yang S; Chandra Family Department of Electrical and Computer Engineering, The University of Texas at Austin., Chaware A; Department of Biomedical Engineering, Duke University, Durham NC, USA., Allier C; HHMI Janelia Research Campus, Ashburn VA, USA., Cai C; Department of Applied Physical Sciences, The University of North Carolina at Chapel Hill, Chapel Hill NC, USA.; Joint Department of Biomedical Engineering, The University of North Carolina at Chapel Hill, Chapel Hill NC, USA., Anderberg G; Department of Radiology, University of Chicago, Chicago IL, USA., Eybposh MH; Department of Applied Physical Sciences, The University of North Carolina at Chapel Hill, Chapel Hill NC, USA.; Joint Department of Biomedical Engineering, The University of North Carolina at Chapel Hill, Chapel Hill NC, USA., Schneider MC; HHMI Janelia Research Campus, Ashburn VA, USA., Heintzmann R; Leibniz Institute of Photonic Technology, Jena, Germany.; Institute of Physical Chemistry and Abbe Center of Photonics, Friedrich-Schiller-Universität Jena, Jena, Germany., Rivera-Sanchez FA; Imaging Physics, Faculty of Applied Sciences, Technische Universiteit Delft, Delft, The Netherlands.; Advanced Research Center for Nanolithography (ARCNL), Amsterdam, The Netherlands., Simmerer C; Department of Biomedical Engineering, Johns Hopkins University, Baltimore MD, USA., Meng G; Herbert Wertheim School of Optometry & Vision Science, Department of Electrical Engineering & Computer Science, University of California, Berkeley CA, USA., Tormes-Vaquerano J; Department of Applied Physical Sciences, The University of North Carolina at Chapel Hill, Chapel Hill NC, USA., Han S; Department of Applied Physics, Yale University, New Haven CT, USA., Shanmugavel SC; Chandra Family Department of Electrical and Computer Engineering, The University of Texas at Austin., Maruvada T; Department of Electrical and Computer Engineering, Johns Hopkins University, Baltimore MD, USA., Yang X; Department of Biomedical Engineering, Duke University, Durham NC, USA., Kim Y; Department of Mechanical Engineering, Yonsei University, Seoul, Republic of Korea., Diederich B; Leibniz Institute of Photonic Technology, Jena, Germany., Joo C; Department of Mechanical Engineering, Yonsei University, Seoul, Republic of Korea., Waller L; Department of Electrical Engineering and Computer Sciences, UC Berkeley, Berkeley CA, USA., Durr NJ; Department of Biomedical Engineering, Johns Hopkins University, Baltimore MD, USA., Pégard NC; Department of Applied Physical Sciences, The University of North Carolina at Chapel Hill, Chapel Hill NC, USA.; Joint Department of Biomedical Engineering, The University of North Carolina at Chapel Hill, Chapel Hill NC, USA.; Neuroscience Center, University of North Carolina at Chapel Hill, Chapel Hill NC, USA.; Carolina Stress Initiative, University of North Carolina at Chapel Hill, Chapel Hill NC, USA., La Rivière PJ; Department of Radiology, University of Chicago, Chicago IL, USA., Horstmeyer R; Department of Biomedical Engineering, Duke University, Durham NC, USA., Chowdhury S; Chandra Family Department of Electrical and Computer Engineering, The University of Texas at Austin., Turaga SC; HHMI Janelia Research Campus, Ashburn VA, USA. |
