| Authors: |
Chickering GR; Brown University, Box G-B397, Providence, Rhode Island 02912, USA. eric_darling@brown.edu.; National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA. gregory.cooksey@nist.gov., Jia LL; National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA. gregory.cooksey@nist.gov., DiSalvo M; National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA. gregory.cooksey@nist.gov., Catterton MA; National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA. gregory.cooksey@nist.gov., Patrone PN; National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA. gregory.cooksey@nist.gov., Darling EM; Brown University, Box G-B397, Providence, Rhode Island 02912, USA. eric_darling@brown.edu., Cooksey GA; National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA. gregory.cooksey@nist.gov. |