Ultrafast metal-to-ligand electron transfer driven by bond shortening revealed through dual-edge computational X-ray spectroscopy.
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| Title: | Ultrafast metal-to-ligand electron transfer driven by bond shortening revealed through dual-edge computational X-ray spectroscopy. |
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| Authors: | Wang SY; School of Physics and Electronic Engineering, Research Institute of Optoelectronic Functional Materials, Jining University, Qufu, Shandong, China.; MIIT Key Laboratory of Semiconductor Microstructure and Quantum Sensing, Department of Applied Physics, School of Physics, Nanjing University of Science and Technology, Nanjing, China., Zhang JR; MIIT Key Laboratory of Semiconductor Microstructure and Quantum Sensing, Department of Applied Physics, School of Physics, Nanjing University of Science and Technology, Nanjing, China., Ge G; MIIT Key Laboratory of Semiconductor Microstructure and Quantum Sensing, Department of Applied Physics, School of Physics, Nanjing University of Science and Technology, Nanjing, China., Hua W; MIIT Key Laboratory of Semiconductor Microstructure and Quantum Sensing, Department of Applied Physics, School of Physics, Nanjing University of Science and Technology, Nanjing, China. wjhua@njust.edu.cn. |
| Source: | Communications chemistry [Commun Chem] 2026 Apr 24; Vol. 9 (1). Date of Electronic Publication: 2026 Apr 24. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Springer Nature Country of Publication: England NLM ID: 101725670 Publication Model: Electronic Cited Medium: Internet ISSN: 2399-3669 (Electronic) Linking ISSN: 23993669 NLM ISO Abbreviation: Commun Chem Subsets: PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
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| ISSN: | 2399-3669 |
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| DOI: | 10.1038/s42004-026-02024-4 |
