APA (7th ed.) Citation

SJK, L., I, E., J, W., A, S., E, M., A, M., . . . C, K. (2026). Wafer-Scale Electrical Characterization of Al/AlxOy/Al Tunnel Junctions for Process Monitoring at Room Temperature. Nanomaterials (Basel, Switzerland), 16(10), . https://doi.org/10.3390/nano16100569

Chicago Style (17th ed.) Citation

SJK, Lang, et al. "Wafer-Scale Electrical Characterization of Al/AlxOy/Al Tunnel Junctions for Process Monitoring at Room Temperature." Nanomaterials (Basel, Switzerland) 16, no. 10 (2026). https://doi.org/10.3390/nano16100569.

MLA (9th ed.) Citation

SJK, Lang, et al. "Wafer-Scale Electrical Characterization of Al/AlxOy/Al Tunnel Junctions for Process Monitoring at Room Temperature." Nanomaterials (Basel, Switzerland), vol. 16, no. 10, 2026, https://doi.org/10.3390/nano16100569.