| Authors: |
Wang X; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, USA. xrwang@mit.edu., Benítez LA; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, USA. lbenitez@mit.edu., Rao S; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, USA., Phong VT; Department of Physics, Florida State University, Tallahassee, FL, USA.; National High Magnetic Field Laboratory, Tallahassee, FL, USA., Chu WI; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, USA., Watanabe K; Research Center for Electronic and Optical Materials, National Institute for Materials Science, Tsukuba, Japan., Taniguchi T; Research Center for Materials Nanoarchitectonics, National Institute for Materials Science, Tsukuba, Japan., Lewandowski C; Department of Physics, Florida State University, Tallahassee, FL, USA.; National High Magnetic Field Laboratory, Tallahassee, FL, USA., Jarillo-Herrero P; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, USA. pjarillo@mit.edu. |
