Cognitively aligned pattern learning: a knowledge-sensitive adaptive framework for multi-class pattern recognition in sEMG systems.
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| Title: | Cognitively aligned pattern learning: a knowledge-sensitive adaptive framework for multi-class pattern recognition in sEMG systems. |
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| Authors: | Vanarasan S; Department of Artificial Intelligence and Machine Learning, Sri Sairam College of Engineering, Anekal, Bengaluru, 562106, India., Pandiaraja P; Department of Computer Science and Engineering, Vel Tech Rangarajan Dr.Sagunthala R&D Institute of Science and Technology, Chennai, Avadi, 600062, TamilNadu, India. sppandiaraja@gmail.com., Kanimozhi R; Department of Artificial Intelligence and Data Science, A.V.C. College of Engineering, Mayiladuthurai, 609305, Tamil Nadu, India., Muthumanickam K; Department of Information Technology, Kongunadu College of Engineering and Technology, Tholurpatti, Tiruchirappalli, 621215, TamilNadu, India. |
| Source: | Scientific reports [Sci Rep] 2026 Jul 07. Date of Electronic Publication: 2026 Jul 07. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 2045-2322 (Electronic) Linking ISSN: 20452322 NLM ISO Abbreviation: Sci Rep Subsets: MEDLINE |
| Database: | MEDLINE Ultimate |
| ISSN: | 2045-2322 |
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| DOI: | 10.1038/s41598-026-61360-6 |
