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Cognitively aligned pattern learning: a knowledge-sensitive adaptive framework for multi-class pattern recognition in sEMG systems.

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Title: Cognitively aligned pattern learning: a knowledge-sensitive adaptive framework for multi-class pattern recognition in sEMG systems.
Authors: Vanarasan S; Department of Artificial Intelligence and Machine Learning, Sri Sairam College of Engineering, Anekal, Bengaluru, 562106, India., Pandiaraja P; Department of Computer Science and Engineering, Vel Tech Rangarajan Dr.Sagunthala R&D Institute of Science and Technology, Chennai, Avadi, 600062, TamilNadu, India. sppandiaraja@gmail.com., Kanimozhi R; Department of Artificial Intelligence and Data Science, A.V.C. College of Engineering, Mayiladuthurai, 609305, Tamil Nadu, India., Muthumanickam K; Department of Information Technology, Kongunadu College of Engineering and Technology, Tholurpatti, Tiruchirappalli, 621215, TamilNadu, India.
Source: Scientific reports [Sci Rep] 2026 Jul 07. Date of Electronic Publication: 2026 Jul 07.
Publication Type: Journal Article
Journal Info: Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 2045-2322 (Electronic) Linking ISSN: 20452322 NLM ISO Abbreviation: Sci Rep Subsets: MEDLINE
Database: MEDLINE Ultimate
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  Data: <searchLink fieldCode="AU" term="%22Vanarasan+S%22">Vanarasan S</searchLink>; Department of Artificial Intelligence and Machine Learning, Sri Sairam College of Engineering, Anekal, Bengaluru, 562106, India.<br /><searchLink fieldCode="AU" term="%22Pandiaraja+P%22">Pandiaraja P</searchLink>; Department of Computer Science and Engineering, Vel Tech Rangarajan Dr.Sagunthala R&D Institute of Science and Technology, Chennai, Avadi, 600062, TamilNadu, India. sppandiaraja@gmail.com.<br /><searchLink fieldCode="AU" term="%22Kanimozhi+R%22">Kanimozhi R</searchLink>; Department of Artificial Intelligence and Data Science, A.V.C. College of Engineering, Mayiladuthurai, 609305, Tamil Nadu, India.<br /><searchLink fieldCode="AU" term="%22Muthumanickam+K%22">Muthumanickam K</searchLink>; Department of Information Technology, Kongunadu College of Engineering and Technology, Tholurpatti, Tiruchirappalli, 621215, TamilNadu, India.
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  Data: <searchLink fieldCode="JN" term="%22101563288%22">Scientific reports</searchLink> [Sci Rep] 2026 Jul 07. <i>Date of Electronic Publication: </i>2026 Jul 07.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Nature+Publishing+Group%22">Nature Publishing Group </searchLink><i>Country of Publication: </i>England <i>NLM ID: </i>101563288 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>2045-2322 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2220452322%22">20452322 </searchLink><i>NLM ISO Abbreviation: </i>Sci Rep <i>Subsets: </i>MEDLINE
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        Value: 10.1038/s41598-026-61360-6
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        Text: English
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      – TitleFull: Cognitively aligned pattern learning: a knowledge-sensitive adaptive framework for multi-class pattern recognition in sEMG systems.
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              Text: 2026 Jul 07
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              Y: 2026
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