Vision expert guided inspection for industrial anomaly detection.
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| Title: | Vision expert guided inspection for industrial anomaly detection. |
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| Authors: | Zhu X; School of Electronic and Information Engineering, University of Science and Technology Liaoning, Anshan, China.; Key Laboratory of Intelligent Constriguction and Internet of Thinfigs Application Technology, Anshan, China., Cui W; Key Laboratory of Intelligent Constriguction and Internet of Thinfigs Application Technology, Anshan, China.; School of Computer Science and Software Engineering, University of Science and Technology Liaoning, Anshan, China., Tao Y; Key Laboratory of Intelligent Constriguction and Internet of Thinfigs Application Technology, Anshan, China.; School of Computer Science and Software Engineering, University of Science and Technology Liaoning, Anshan, China., Wang X; School of Electronic and Information Engineering, University of Science and Technology Liaoning, Anshan, China.; Key Laboratory of Intelligent Constriguction and Internet of Thinfigs Application Technology, Anshan, China. |
| Source: | PloS one [PLoS One] 2026 Jul 08; Vol. 21 (7), pp. e0353291. Date of Electronic Publication: 2026 Jul 08 (Print Publication: 2026). |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Public Library of Science Country of Publication: United States NLM ID: 101285081 Publication Model: eCollection Cited Medium: Internet ISSN: 1932-6203 (Electronic) Linking ISSN: 19326203 NLM ISO Abbreviation: PLoS One Subsets: MEDLINE |
| Database: | MEDLINE Ultimate |
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| ISSN: | 1932-6203 |
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| DOI: | 10.1371/journal.pone.0353291 |
