Revealing buried layers in oxide heterostructures with scanning transmission electron microscopy using integrated differential phase contrast (STEM-iDPC) imaging.

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Bibliographic Details
Title: Revealing buried layers in oxide heterostructures with scanning transmission electron microscopy using integrated differential phase contrast (STEM-iDPC) imaging.
Authors: Dinkar DK; School of Engineering and Materials Science, Queen Mary University of London, London, United Kingdom of Great Britain and Northern Ireland., Dixon SC; Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, United Kingdom of Great Britain and Northern Ireland., Guiney I; Paragraf Limited, Cambridgeshire, United Kingdom of Great Britain and Northern Ireland., Allen CS; Electron Physical Science Imaging Centre (ePSIC), Diamond Light Source Limited, Oxford, United Kingdom of Great Britain and Northern Ireland.; Department of Materials, University of Oxford, Oxford, United Kingdom of Great Britain and Northern Ireland., Humphreys C; School of Engineering and Materials Science, Queen Mary University of London, London, United Kingdom of Great Britain and Northern Ireland.
Source: Journal of microscopy [J Microsc] 2026 Jul 15. Date of Electronic Publication: 2026 Jul 15.
Publication Type: Journal Article
Journal Info: Publisher: Published for the Royal Microscopical Society by Blackwell Scientific Publications Country of Publication: England NLM ID: 0204522 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1365-2818 (Electronic) Linking ISSN: 00222720 NLM ISO Abbreviation: J Microsc Subsets: MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:1365-2818
DOI:10.1111/jmi.70149