Low-Cost Direct Electron Detection in the SEM for EBSD and ECCI.

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Bibliographic Details
Title: Low-Cost Direct Electron Detection in the SEM for EBSD and ECCI.
Authors: Tessmer, Joseph, Graef, Marc De
Source: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2021 Supplement 1; Vol. 27.
Journal Info: Publisher: Oxford University Press / USA ISSN: 1431-9276
Database: MEDLINE Ultimate
Description
ISSN:1435-8115
DOI:10.1017/S1431927621003780