APA (7th ed.) Citation

Tessmer, J., & Graef, M. D. (2021). Low-Cost Direct Electron Detection in the SEM for EBSD and ECCI. Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 27, 998. https://doi.org/10.1017/S1431927621003780

Chicago Style (17th ed.) Citation

Tessmer, Joseph, and Marc De Graef. "Low-Cost Direct Electron Detection in the SEM for EBSD and ECCI." Microscopy and Microanalysis: The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 27 (2021): 998. https://doi.org/10.1017/S1431927621003780.

MLA (9th ed.) Citation

Tessmer, Joseph, and Marc De Graef. "Low-Cost Direct Electron Detection in the SEM for EBSD and ECCI." Microscopy and Microanalysis: The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol. 27, 2021, p. 998, https://doi.org/10.1017/S1431927621003780.