View in EDS HTML Full Text PDF Full Text

Practical Aspects of X-Ray Mapping in Electron Probe Microanalysis of Minerals.

Saved in:
Bibliographic Details
Title: Practical Aspects of X-Ray Mapping in Electron Probe Microanalysis of Minerals.
Authors: Goemann, Karsten, Abersteiner, Adam, Kamenetsky, Vadim S.
Source: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2022 Supplement; Vol. 28.
Journal Info: Publisher: Oxford University Press / USA ISSN: 1431-9276
Database: MEDLINE Ultimate
Full text is not displayed to guests.
Description
ISSN:1435-8115
DOI:10.1017/S1431927622002677