Analysis of Crystal Defects by Electron Channeling Contrast Imaging (ECCI) for the Advancement of Structural Materials.
Saved in:
| Title: | Analysis of Crystal Defects by Electron Channeling Contrast Imaging (ECCI) for the Advancement of Structural Materials. |
|---|---|
| Authors: | Bale, Hrishikesh, Abdelloui, Lamya, Tordoff, Benjamin, Zaefferer, Stefan |
| Source: | Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 2024 Supplement; Vol. 30. |
| Journal Info: | Publisher: Oxford University Press / USA ISSN: 1431-9276 |
| Database: | MEDLINE Ultimate |
|
Full text is not displayed to guests.
Login for full access.
|
|
| ISSN: | 1435-8115 |
|---|---|
| DOI: | 10.1093/mam/ozae044.131 |