Bibliographic Details
| Title: |
Enhancement of Low Energy / Light Element Energy Dispersive Analysis in the Scanning Electron Microscope Using a Non-Focusing X-Ray Optic. |
| Authors: |
Edelmann, RE, Vasudevan, V, Kohls, D, Ullmer, J |
| Source: |
Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Jul2009 Supplement 2; Vol. 15 (S2). |
| Journal Info: |
Publisher: Oxford University Press / USA ISSN: 1431-9276 |
| Database: |
MEDLINE Ultimate |
