APA (7th ed.) Citation

Edelmann, R., Vasudevan, V., Kohls, D., & Ullmer, J. (2009). Enhancement of Low Energy / Light Element Energy Dispersive Analysis in the Scanning Electron Microscope Using a Non-Focusing X-Ray Optic. Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 15(S2), 218. https://doi.org/10.1017/S1431927609095427

Chicago Style (17th ed.) Citation

Edelmann, RE, V. Vasudevan, D. Kohls, and J. Ullmer. "Enhancement of Low Energy / Light Element Energy Dispersive Analysis in the Scanning Electron Microscope Using a Non-Focusing X-Ray Optic." Microscopy and Microanalysis: The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 15, no. S2 (2009): 218. https://doi.org/10.1017/S1431927609095427.

MLA (9th ed.) Citation

Edelmann, RE, et al. "Enhancement of Low Energy / Light Element Energy Dispersive Analysis in the Scanning Electron Microscope Using a Non-Focusing X-Ray Optic." Microscopy and Microanalysis: The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol. 15, no. S2, 2009, p. 218, https://doi.org/10.1017/S1431927609095427.