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Enhancement of Low Energy / Light Element Energy Dispersive Analysis in the Scanning Electron Microscope Using a Non-Focusing X-Ray Optic.

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Title: Enhancement of Low Energy / Light Element Energy Dispersive Analysis in the Scanning Electron Microscope Using a Non-Focusing X-Ray Optic.
Authors: Edelmann, RE, Vasudevan, V, Kohls, D, Ullmer, J
Source: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Jul2009 Supplement 2; Vol. 15 (S2).
Journal Info: Publisher: Oxford University Press / USA ISSN: 1431-9276
Database: MEDLINE Ultimate
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  Data: Enhancement of Low Energy / Light Element Energy Dispersive Analysis in the Scanning Electron Microscope Using a Non-Focusing X-Ray Optic.
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  Data: <searchLink fieldCode="AU" term="%22Edelmann%2C+RE%22">Edelmann, RE</searchLink><br /><searchLink fieldCode="AU" term="%22Vasudevan%2C+V%22">Vasudevan, V</searchLink><br /><searchLink fieldCode="AU" term="%22Kohls%2C+D%22">Kohls, D</searchLink><br /><searchLink fieldCode="AU" term="%22Ullmer%2C+J%22">Ullmer, J</searchLink>
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=mdl&AN=EPTOC57326396
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      – Type: doi
        Value: 10.1017/S1431927609095427
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      – Code: eng
        Text: English
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        StartPage: 218
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      – TitleFull: Enhancement of Low Energy / Light Element Energy Dispersive Analysis in the Scanning Electron Microscope Using a Non-Focusing X-Ray Optic.
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            NameFull: Edelmann, RE
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            NameFull: Vasudevan, V
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            NameFull: Kohls, D
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            – D: 03
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              Text: Jul2009 Supplement 2
              Type: published
              Y: 2009
          Identifiers:
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              Value: 1435-8115
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              Value: 15
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              Value: S2
          Titles:
            – TitleFull: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
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