Enhancement of Low Energy / Light Element Energy Dispersive Analysis in the Scanning Electron Microscope Using a Non-Focusing X-Ray Optic.
Saved in:
| Title: | Enhancement of Low Energy / Light Element Energy Dispersive Analysis in the Scanning Electron Microscope Using a Non-Focusing X-Ray Optic. |
|---|---|
| Authors: | Edelmann, RE, Vasudevan, V, Kohls, D, Ullmer, J |
| Source: | Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Jul2009 Supplement 2; Vol. 15 (S2). |
| Journal Info: | Publisher: Oxford University Press / USA ISSN: 1431-9276 |
| Database: | MEDLINE Ultimate |
Be the first to leave a comment!