Enhancement of Low Energy / Light Element Energy Dispersive Analysis in the Scanning Electron Microscope Using a Non-Focusing X-Ray Optic.

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Bibliographic Details
Title: Enhancement of Low Energy / Light Element Energy Dispersive Analysis in the Scanning Electron Microscope Using a Non-Focusing X-Ray Optic.
Authors: Edelmann, RE, Vasudevan, V, Kohls, D, Ullmer, J
Source: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Jul2009 Supplement 2; Vol. 15 (S2).
Journal Info: Publisher: Oxford University Press / USA ISSN: 1431-9276
Database: MEDLINE Ultimate
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