TEM Studies of Au/Si Epilayer Interfaces.

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Bibliographic Details
Title:	TEM Studies of Au/Si Epilayer Interfaces.
Authors:	Wang, F, Sayed, SY, Malac, M, Wang, D, Egerton, R, Buriak, J
Source:	Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Jul2009 Supplement 2; Vol. 15 (S2).
Journal Info:	Publisher: Oxford University Press / USA ISSN: 1431-9276
Database:	MEDLINE Ultimate

Description
ISSN:	1435-8115
DOI:	10.1017/S1431927609095658