APA (7th ed.) Citation

Wang, F., Sayed, S., Malac, M., Wang, D., Egerton, R., & Buriak, J. (2009). TEM Studies of Au/Si Epilayer Interfaces. Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 15(S2), 1450. https://doi.org/10.1017/S1431927609095658

Chicago Style (17th ed.) Citation

Wang, F., SY Sayed, M. Malac, D. Wang, R. Egerton, and J. Buriak. "TEM Studies of Au/Si Epilayer Interfaces." Microscopy and Microanalysis: The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 15, no. S2 (2009): 1450. https://doi.org/10.1017/S1431927609095658.

MLA (9th ed.) Citation

Wang, F., et al. "TEM Studies of Au/Si Epilayer Interfaces." Microscopy and Microanalysis: The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol. 15, no. S2, 2009, p. 1450, https://doi.org/10.1017/S1431927609095658.