TEM Studies of Au/Si Epilayer Interfaces.
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| Title: | TEM Studies of Au/Si Epilayer Interfaces. |
|---|---|
| Authors: | Wang, F, Sayed, SY, Malac, M, Wang, D, Egerton, R, Buriak, J |
| Source: | Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Jul2009 Supplement 2; Vol. 15 (S2). |
| Journal Info: | Publisher: Oxford University Press / USA ISSN: 1431-9276 |
| Database: | MEDLINE Ultimate |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: mdl DbLabel: MEDLINE Ultimate An: EPTOC57326419 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: TEM Studies of Au/Si Epilayer Interfaces. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Wang%2C+F%22">Wang, F</searchLink><br /><searchLink fieldCode="AU" term="%22Sayed%2C+SY%22">Sayed, SY</searchLink><br /><searchLink fieldCode="AU" term="%22Malac%2C+M%22">Malac, M</searchLink><br /><searchLink fieldCode="AU" term="%22Wang%2C+D%22">Wang, D</searchLink><br /><searchLink fieldCode="AU" term="%22Egerton%2C+R%22">Egerton, R</searchLink><br /><searchLink fieldCode="AU" term="%22Buriak%2C+J%22">Buriak, J</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%229712707%22">Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada</searchLink> Jul2009 Supplement 2; Vol. 15 (S2). – Name: TitleSource Label: Journal Info Group: Src Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Oxford+University+Press+%2F+USA%22">Oxford University Press / USA </searchLink><i>ISSN: </i>1431-9276 |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=mdl&AN=EPTOC57326419 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1017/S1431927609095658 Languages: – Code: eng Text: English PhysicalDescription: Pagination: StartPage: 1450 Titles: – TitleFull: TEM Studies of Au/Si Epilayer Interfaces. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Wang, F – PersonEntity: Name: NameFull: Sayed, SY – PersonEntity: Name: NameFull: Malac, M – PersonEntity: Name: NameFull: Wang, D – PersonEntity: Name: NameFull: Egerton, R – PersonEntity: Name: NameFull: Buriak, J IsPartOfRelationships: – BibEntity: Dates: – D: 03 M: 07 Text: Jul2009 Supplement 2 Type: published Y: 2009 Identifiers: – Type: issn-print Value: 1435-8115 Numbering: – Type: volume Value: 15 – Type: issue Value: S2 Titles: – TitleFull: Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Type: main |
| ResultId | 1 |