TEM Studies of Au/Si Epilayer Interfaces.
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| Title: | TEM Studies of Au/Si Epilayer Interfaces. |
|---|---|
| Authors: | Wang, F, Sayed, SY, Malac, M, Wang, D, Egerton, R, Buriak, J |
| Source: | Microscopy and microanalysis: the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada Jul2009 Supplement 2; Vol. 15 (S2). |
| Journal Info: | Publisher: Oxford University Press / USA ISSN: 1431-9276 |
| Database: | MEDLINE Ultimate |
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