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Modeling and Simple Parameters Extraction of Calibration Standards for Accurate Mm‐Wave On‐Wafer Measurements up to 110 GHz.

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Bibliographic Details
Title: Modeling and Simple Parameters Extraction of Calibration Standards for Accurate Mm‐Wave On‐Wafer Measurements up to 110 GHz.
Authors: Liu, Kaiyue1 (AUTHOR), Liu, Shuchao2 (AUTHOR), Wang, Zeyu3 (AUTHOR), Si, Liming1 (AUTHOR), Latino, Mariangela4 (AUTHOR), Crupi, Giovanni5 (AUTHOR), Sun, Houjun1 (AUTHOR), Bao, Xiue1,2 (AUTHOR) xiue.bao@bit.edu.cn
Source: International Journal of Numerical Modelling. May/Jun2025, Vol. 38 Issue 3, p1-9. 9p.
Database: Mathematics Source
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ISSN:08943370
DOI:10.1002/jnm.70056