ISTFA 2017 : Conference Proceedings From the 43rd International Symposium for Testing and Failure Analysis: November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA
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| Title: | ISTFA 2017 : Conference Proceedings From the 43rd International Symposium for Testing and Failure Analysis: November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA |
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| Description: | The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process. |
| Authors: | ASM International, Electronic Device Failure Analysis Society |
| Resource Type: | eBook. |
| Subjects: | Electronics--Materials--Testing--Congresses, Electronic apparatus and appliances--Testing--Congresses |
| Categories: | TECHNOLOGY & ENGINEERING / Mechanical |
| Database: | eBook Collection (EBSCOhost) |
| Abstract: | The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process. |
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| ISBN: | 9781627081504 9781627081511 |
