International, A., & Society, E. D. F. A. (2017). ISTFA 2017: Conference Proceedings From the 43rd International Symposium for Testing and Failure Analysis: November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA.
Chicago Style (17th ed.) CitationInternational, ASM, and Electronic Device Failure Analysis Society. ISTFA 2017: Conference Proceedings From the 43rd International Symposium for Testing and Failure Analysis: November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA. 2017.
MLA (9th ed.) CitationInternational, ASM, and Electronic Device Failure Analysis Society. ISTFA 2017: Conference Proceedings From the 43rd International Symposium for Testing and Failure Analysis: November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA. 2017.