View in EDS PDF Full Text

ISTFA 2017 : Conference Proceedings From the 43rd International Symposium for Testing and Failure Analysis: November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA

Saved in:
Bibliographic Details
Title: ISTFA 2017 : Conference Proceedings From the 43rd International Symposium for Testing and Failure Analysis: November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA
Description: The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Authors: ASM International, Electronic Device Failure Analysis Society
Resource Type: eBook.
Subjects: Electronics--Materials--Testing--Congresses, Electronic apparatus and appliances--Testing--Congresses
Categories: TECHNOLOGY & ENGINEERING / Mechanical
Database: eBook Collection (EBSCOhost)
FullText Links:
  – Type: ebook-pdf
Text:
  Availability: 0
Header DbId: nlebk
DbLabel: eBook Collection (EBSCOhost)
An: 1884540
RelevancyScore: 1077
AccessLevel: 6
PubType: eBook
PubTypeId: ebook
PreciseRelevancyScore: 1077.00524902344
IllustrationInfo
ImageInfo – Size: thumb
  Target: https://rps2images.ebscohost.com/rpsweb/othumb?id=NL$1884540$PDF&s=r
– Size: medium
  Target: https://rps2images.ebscohost.com/rpsweb/othumb?id=NL$1884540$PDF&s=d
Items – Name: Title
  Label: Title
  Group: Ti
  Data: ISTFA 2017 : Conference Proceedings From the 43rd International Symposium for Testing and Failure Analysis: November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA
– Name: Abstract
  Label: Description
  Group: Ab
  Data: The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22ASM+International%22">ASM International</searchLink><br /><searchLink fieldCode="AR" term="%22Electronic+Device+Failure+Analysis+Society%22">Electronic Device Failure Analysis Society</searchLink>
– Name: TypePub
  Label: Resource Type
  Group: TypPub
  Data: eBook.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Electronics--Materials--Testing--Congresses%22">Electronics--Materials--Testing--Congresses</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+apparatus+and+appliances--Testing--Congresses%22">Electronic apparatus and appliances--Testing--Congresses</searchLink>
– Name: SubjectBISAC
  Label: Categories
  Group: Su
  Data: <searchLink fieldCode="ZK" term="%22TECHNOLOGY+%26+ENGINEERING+%2F+Mechanical%22">TECHNOLOGY & ENGINEERING / Mechanical</searchLink>
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=nlebk&AN=1884540
RecordInfo BibRecord:
  BibEntity:
    Classifications:
      – Code: 621.38152
        Scheme: ddc
        Type: prePub
    Languages:
      – Code: eng
        Text: English
    Subjects:
      – SubjectFull: Electronics--Materials--Testing--Congresses
        Type: general
      – SubjectFull: Electronic apparatus and appliances--Testing--Congresses
        Type: general
    Titles:
      – TitleFull: ISTFA 2017 : Conference Proceedings From the 43rd International Symposium for Testing and Failure Analysis: November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: ASM International
      – PersonEntity:
          Name:
            NameFull: Electronic Device Failure Analysis Society
      – PersonEntity:
          Name:
            NameFull: ASM International
      – PersonEntity:
          Name:
            NameFull: Electronic Device Failure Analysis Society
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 01
              Type: published
              Y: 2017
            – D: 02
              M: 10
              Type: profile
              Y: 2018
          Identifiers:
            – Type: isbn-print
              Value: 9781627081504
            – Type: isbn-electronic
              Value: 9781627081511
          Titles:
            – TitleFull: ISTFA 2017 : Conference Proceedings From the 43rd International Symposium for Testing and Failure Analysis: November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA
              Type: main
ResultId 1