Advanced Production Testing of RF, SoC, and SiP Devices

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Bibliographic Details
Title: Advanced Production Testing of RF, SoC, and SiP Devices
Authors: Kelly, Joe, Engelhart, Michael
Resource Type: eBook.
Subjects: Systems on a chip--Testing
Categories: TECHNOLOGY & ENGINEERING / Electronics / Circuits / General, TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated
Database: eBook Collection (EBSCOhost)
Description
ISBN:9781580537094
9781580537100