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Advanced Production Testing of RF, SoC, and SiP Devices

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Bibliographic Details
Title: Advanced Production Testing of RF, SoC, and SiP Devices
Authors: Kelly, Joe, Engelhart, Michael
Resource Type: eBook.
Subjects: Systems on a chip--Testing
Categories: TECHNOLOGY & ENGINEERING / Electronics / Circuits / General, TECHNOLOGY & ENGINEERING / Electronics / Circuits / Integrated
Database: eBook Collection (EBSCOhost)
FullText Links:
  – Type: ebook-pdf
Text:
  Availability: 0
Header DbId: nlebk
DbLabel: eBook Collection (EBSCOhost)
An: 225173
RelevancyScore: 1012
AccessLevel: 6
PubType: eBook
PubTypeId: ebook
PreciseRelevancyScore: 1011.53295898438
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RecordInfo BibRecord:
  BibEntity:
    Classifications:
      – Code: 621.3815
        Scheme: ddc
        Type: prePub
    Languages:
      – Code: eng
        Text: English
    Subjects:
      – SubjectFull: Systems on a chip--Testing
        Type: general
    Titles:
      – TitleFull: Advanced Production Testing of RF, SoC, and SiP Devices
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Kelly, Joe
      – PersonEntity:
          Name:
            NameFull: Engelhart, Michael
      – PersonEntity:
          Name:
            NameFull: Kelly, Joe
      – PersonEntity:
          Name:
            NameFull: Engelhart, Michael
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 01
              Type: published
              Y: 2007
            – D: 04
              M: 02
              Type: profile
              Y: 2014
          Identifiers:
            – Type: isbn-print
              Value: 9781580537094
            – Type: isbn-electronic
              Value: 9781580537100
          Titles:
            – TitleFull: Advanced Production Testing of RF, SoC, and SiP Devices
              Type: main
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